Fangzhou Xia

@article{2022MDPIBiosensors,

title = {Review: Advanced Atomic Force Microscopy for Biomedical Research},

author = {Fangzhou Xia* and Kamal Youcef-Toumi},

url = {https://www.mdpi.com/2079-6374/12/12/1116},

year  = {2022},

date = {2022-01-01},

urldate = {2022-01-01},

journal = {Biosensors},

volume = {12},

number = {12},

pages = {1116},

publisher = {MDPI},

abstract = {Visualization of biomedical samples in their native environments at the microscopic scale is crucial for studying fundamental principles and discovering biomedical systems with complex interaction. The study of dynamic biological processes requires a microscope system with multiple modalities, high spatial/temporal resolution, large imaging ranges, versatile imaging environments and ideally in-situ manipulation capabilities. Recent development of new Atomic Force Microscopy (AFM) capabilities has made it such a powerful tool for biological and biomedical research. This review introduces novel AFM functionalities including high-speed imaging for dynamic process visualization, mechanobiology with force spectroscopy, molecular species characterization, and AFM nano-manipulation. These capabilities enable many new possibilities for novel scientific research and allow scientists to observe and explore processes at the nanoscale like never before. Selected application examples from recent studies are provided to demonstrate the effectiveness of these AFM techniques.},

keywords = {Atomic Force Microscopy, Instrumentation, Medication, MEMS, Nanorobotics, Review},

pubstate = {published},

tppubtype = {article}

}

@article{2017JVST,

title = {Active scanning probes: A versatile toolkit for fast imaging and emerging nanofabrication},

author = {Ivo W Rangelow* and Tzvetan Ivanov and Ahmad Ahmad and Marcus Kaestner and Claudia Lenk and Iman S Bozchalooi and Fangzhou Xia* and Kamal Youcef-Toumi and Mathias Holz and Alexander Reum},

url = {https://avs.scitation.org/doi/10.1116/1.4992073},

year  = {2017},

date = {2017-01-01},

urldate = {2017-01-01},

journal = {Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena},

volume = {35},

number = {6},

pages = {06G101},

publisher = {AVS},

abstract = {With the recent advances in the field of nanotechnology, measurement and manipulation requirements at the nanoscale have become more stringent than ever before. In atomic force microscopy, high-speed performance alone is not sufficient without considerations of other aspects of the measurement task, such as the feature aspect ratio, required range, or acceptable probe-sample interaction forces. In this paper, the authors discuss these requirements and the research directions that provide the highest potential in meeting them. The authors elaborate on the efforts toward the downsizing of self-sensed and self-actuated probes as well as on upscaling by active cantilever arrays. The authors present the fabrication process of active probes along with the tip customizations carried out targeting specific application fields. As promising application in scope of nanofabrication, field emission scanning probe lithography is introduced. The authors further discuss their control and design approach. Here, microactuators, e.g., multilayer microcantilevers, and macroactuators, e.g., flexure scanners, are combined in order to simultaneously meet both the range and speed requirements of a new generation of scanning probe microscopes.},

keywords = {Actuator, Atomic Force Microscopy, Instrumentation, MEMS, Nanorobotics, Review, Sensor},

pubstate = {published},

tppubtype = {article}

}