2024
5.
Fangzhou Xia*; Ivo W Rangelow; Kamal Youcef-Toumi
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation Book
Springer, 2024, ISBN: 978-3-031-44232-2.
Abstract | Links | BibTeX | Tags: Actuator, Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Mechatronics, MEMS, Modeling & Simulation, Motion Control, Nanorobotics, Piezoelectricity, Review, Sensor, Signal Processing, Theory
@book{2023AFMbook,
title = {Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation},
author = {Fangzhou Xia* and Ivo W Rangelow and Kamal Youcef-Toumi},
url = {https://link.springer.com/book/10.1007/978-3-031-44233-9},
doi = {https://doi.org/10.1007/978-3-031-44233-9},
isbn = {978-3-031-44232-2},
year = {2024},
date = {2024-02-06},
urldate = {2023-10-01},
publisher = {Springer},
abstract = {From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of the instrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists.},
keywords = {Actuator, Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Mechatronics, MEMS, Modeling & Simulation, Motion Control, Nanorobotics, Piezoelectricity, Review, Sensor, Signal Processing, Theory},
pubstate = {published},
tppubtype = {book}
}
From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of the instrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists.
2023
4.
Lufan Wang; Rouying Chu; Fangzhou Xia; Zhuoxuan Li*; Yan Wei; Yiming Rong
Project-based Learning Course Co-designed with Regional Enterprises Proceedings Article
In: ASEE 2023 Annual Exposition & Conference, American Society for Engineering Education, 2023.
Abstract | Links | BibTeX | Tags: Design, Education
@inproceedings{2023ASEE,
title = {Project-based Learning Course Co-designed with Regional Enterprises},
author = {Lufan Wang and Rouying Chu and Fangzhou Xia and Zhuoxuan Li* and Yan Wei and Yiming Rong},
url = {https://peer.asee.org/board-49-project-based-learning-course-co-designed-with-regional-enterprises},
year = {2023},
date = {2023-06-25},
urldate = {2023-06-25},
booktitle = {ASEE 2023 Annual Exposition & Conference},
publisher = {American Society for Engineering Education},
abstract = {Project-based learning (PBL) courses in higher education require the instructor team to be highly resourceful, multi-disciplined, and inspiring. It also needs student teams to be proactive, collaborative, and good at inquiries. Designing and implementing PBL in a classroom can be challenging due to teaching staff shortage and insufficient knowledge of instructors. To address these challenges, we proposed a novel PBL course design methodology to involve local enterprises and entrepreneurs as course co-instructors, thereby compensating for the lack of industry participation in the current PBL course development efforts. The methodology consists of five main pillars: (1) inquiry-based problem solving using practical real-world problems; (2) active knowledge construction through a multidisciplinary team; (3) situated learning through meaningful social interaction with a community of practice; (4) guided investigation with scaffolded instructions on research methodology and technology; and (5) prototype demonstration with expert feedback. To test the effectiveness of the PBL course design methodology, we performed two experiments at Southern University of Science and Technology, a top research university in Shenzhen, China, in a form of a three-week summer school. Two-year data was collected including archival course data, interview data of students, faculty and industry partners, as well as student feedback surveys. We found that the proposed PBL curriculum involving industry mentors can significantly improve students’ engineering design skills and effectiveness of learning.
},
keywords = {Design, Education},
pubstate = {published},
tppubtype = {inproceedings}
}
Project-based learning (PBL) courses in higher education require the instructor team to be highly resourceful, multi-disciplined, and inspiring. It also needs student teams to be proactive, collaborative, and good at inquiries. Designing and implementing PBL in a classroom can be challenging due to teaching staff shortage and insufficient knowledge of instructors. To address these challenges, we proposed a novel PBL course design methodology to involve local enterprises and entrepreneurs as course co-instructors, thereby compensating for the lack of industry participation in the current PBL course development efforts. The methodology consists of five main pillars: (1) inquiry-based problem solving using practical real-world problems; (2) active knowledge construction through a multidisciplinary team; (3) situated learning through meaningful social interaction with a community of practice; (4) guided investigation with scaffolded instructions on research methodology and technology; and (5) prototype demonstration with expert feedback. To test the effectiveness of the PBL course design methodology, we performed two experiments at Southern University of Science and Technology, a top research university in Shenzhen, China, in a form of a three-week summer school. Two-year data was collected including archival course data, interview data of students, faculty and industry partners, as well as student feedback surveys. We found that the proposed PBL curriculum involving industry mentors can significantly improve students’ engineering design skills and effectiveness of learning.
3.
Fangzhou Xia*; Shane Lovet; Eyan Forsythe; Malek Ibrahim; Kamal Youcef-Toumi
AFM SMILER: A Scale Model Interactive Learning Extended Reality Toolkit for Atomic Force Microscopy based on Digital Twin Technology Journal Article
In: IEEE Transactions on Mechatronics (in preparation), 2023.
Abstract | Links | BibTeX | Tags: Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Intelligence, Mechatronics, MEMS, Modeling & Simulation, Nanorobotics, Sensor, Theory
@article{2023IEEETM,
title = {AFM SMILER: A Scale Model Interactive Learning Extended Reality Toolkit for Atomic Force Microscopy based on Digital Twin Technology},
author = {Fangzhou Xia* and Shane Lovet and Eyan Forsythe and Malek Ibrahim and Kamal Youcef-Toumi},
url = {https://ieeexplore.ieee.org/abstract/document/10136835},
doi = {10.1109/TMECH.2023.3274695},
year = {2023},
date = {2023-06-01},
urldate = {2023-01-01},
journal = {IEEE Transactions on Mechatronics (in preparation)},
abstract = {Atomic force microscope (AFM) is a precision mechatronic system for nanoscale imaging of surfaces. Due to limited instrument access and lack of visualization techniques, understanding its principles can be challenging. Digital twin technology allows the creation of virtual representations of physical systems, which can be particularly useful to address challenges in AFM education. To realistically simulate nanoscale physics, we first developed new efficient algorithms for four virtual scale models, including cantilever mechanics, probe transducers, controller tuning, and contact mechanics. Second, three simulated experiment interactive learning modules are developed for instrument operation, including virtual imaging, system overview, and imaging modalities. In the end, three hardware systems are integrated for an extended reality experience, including a macroscopic AFM scale model, a haptic device for probe-sample interaction force feedback and an upgraded low-cost educational AFM for nanoscale imaging and instrumentation. This completes the eight total modules for the AFM SMILER: A Scale Model Interactive Learning Extended Reality toolkit. Preliminary studies shows the toolkit being helpful for AFM education. In addition to mechatronics and nanotechnology education, techniques developed in this work can be generally applied to computationally efficient realistic digital twin creation.},
keywords = {Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Intelligence, Mechatronics, MEMS, Modeling & Simulation, Nanorobotics, Sensor, Theory},
pubstate = {published},
tppubtype = {article}
}
Atomic force microscope (AFM) is a precision mechatronic system for nanoscale imaging of surfaces. Due to limited instrument access and lack of visualization techniques, understanding its principles can be challenging. Digital twin technology allows the creation of virtual representations of physical systems, which can be particularly useful to address challenges in AFM education. To realistically simulate nanoscale physics, we first developed new efficient algorithms for four virtual scale models, including cantilever mechanics, probe transducers, controller tuning, and contact mechanics. Second, three simulated experiment interactive learning modules are developed for instrument operation, including virtual imaging, system overview, and imaging modalities. In the end, three hardware systems are integrated for an extended reality experience, including a macroscopic AFM scale model, a haptic device for probe-sample interaction force feedback and an upgraded low-cost educational AFM for nanoscale imaging and instrumentation. This completes the eight total modules for the AFM SMILER: A Scale Model Interactive Learning Extended Reality toolkit. Preliminary studies shows the toolkit being helpful for AFM education. In addition to mechatronics and nanotechnology education, techniques developed in this work can be generally applied to computationally efficient realistic digital twin creation.
2022
2.
Fangzhou Xia*; Morgan P Mayborne; Qiong Ma; Kamal Youcef-Toumi
Physical Intelligence in the Metaverse: Mixed Reality Scale Models for Twistronics and Atomic Force Microscopy Proceedings Article
In: 2022 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM), pp. 1722-1729, 2022.
Abstract | Links | BibTeX | Tags: Actuator, Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Intelligence, Material Science, Mechatronics, MEMS, Modeling & Simulation, Nanorobotics, Sensor
@inproceedings{2022IEEEAIM,
title = {Physical Intelligence in the Metaverse: Mixed Reality Scale Models for Twistronics and Atomic Force Microscopy},
author = {Fangzhou Xia* and Morgan P Mayborne and Qiong Ma and Kamal Youcef-Toumi},
url = {https://ieeexplore.ieee.org/document/9863383},
doi = {10.1109/AIM52237.2022.9863383},
year = {2022},
date = {2022-01-01},
urldate = {2022-01-01},
booktitle = {2022 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM)},
pages = {1722-1729},
abstract = {Physical intelligence (PI) is an emerging research field using new multi-functional smart materials in mechatronic designs. On the microscopic scale, PI principles give rise to unconventional transducers, which are especially useful for micro/nano-robot design with size and resource constrains. Since it is not easy to directly observe nanoscale multi-physics phenomenon, understanding their principles can be challenging. In this work, we bring PI principles into the metaverse to bridge this gap by developing two mixed reality scale models. The first example is a virtual reality (VR) 2D material twistronics visualizer to demonstrate the novel intelligent 2D materials with tunable properties as a rising field in condensed matter physics. Users can interactively control the cross-coupling multi-physics phenomena and observe the visualized material responses. The second example is centered around an Atomic Force Microscope (AFM) to illustrate its imaging and probe principles. For interaction, users can control the twist angle using atomic lattice models and feel the AFM cantilever force using custom haptic devices. We believe these tools can help precision mechatronic engineers understand and make better use of physical intelligence building blocks to design micro-electromechanical systems.},
keywords = {Actuator, Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Intelligence, Material Science, Mechatronics, MEMS, Modeling & Simulation, Nanorobotics, Sensor},
pubstate = {published},
tppubtype = {inproceedings}
}
Physical intelligence (PI) is an emerging research field using new multi-functional smart materials in mechatronic designs. On the microscopic scale, PI principles give rise to unconventional transducers, which are especially useful for micro/nano-robot design with size and resource constrains. Since it is not easy to directly observe nanoscale multi-physics phenomenon, understanding their principles can be challenging. In this work, we bring PI principles into the metaverse to bridge this gap by developing two mixed reality scale models. The first example is a virtual reality (VR) 2D material twistronics visualizer to demonstrate the novel intelligent 2D materials with tunable properties as a rising field in condensed matter physics. Users can interactively control the cross-coupling multi-physics phenomena and observe the visualized material responses. The second example is centered around an Atomic Force Microscope (AFM) to illustrate its imaging and probe principles. For interaction, users can control the twist angle using atomic lattice models and feel the AFM cantilever force using custom haptic devices. We believe these tools can help precision mechatronic engineers understand and make better use of physical intelligence building blocks to design micro-electromechanical systems.
2021
1.
Fangzhou Xia*; James Edwin Quigley; Xiaotong Zhang; Chen Yang; Yi Wang; Kamal Youcef-Toumi
A Modular Low-cost Atomic Force Microscope for Precision Mechatronics Education Journal Article
In: Mechatronics, vol. 76, pp. 102550, 2021, ISSN: 0957-4158.
Abstract | Links | BibTeX | Tags: Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Mechatronics, Nanorobotics, Signal Processing
@article{2021Mechatronics,
title = {A Modular Low-cost Atomic Force Microscope for Precision Mechatronics Education},
author = {Fangzhou Xia* and James Edwin Quigley and Xiaotong Zhang and Chen Yang and Yi Wang and Kamal Youcef-Toumi},
url = {https://www.sciencedirect.com/science/article/abs/pii/S0957415821000441},
issn = {0957-4158},
year = {2021},
date = {2021-01-01},
urldate = {2021-01-01},
journal = {Mechatronics},
volume = {76},
pages = {102550},
publisher = {Elsevier},
abstract = {Precision mechatronics and nanotechnology communities can both benefit from a course centered around an Atomic Force Microscope (AFM). Developing an AFM can provide precision mechatronics engineers with a valuable multidisciplinary hands-on training experience. In return, such expertise can be applied to the design and implementation of new precision instruments, which helps nanotechnology researchers make new scientific discoveries. However, existing AFMs are not suitable for mechatronics education due to their different original design intentions. Therefore, we address this challenge by developing an AFM intended for precision mechatronics education.
This paper presents the design and implementation of an educational AFM and its corresponding precision mechatronics class. The modular educational AFM is low-cost (<4,000$) and easy to operate. The cost reduction is enabled by new subsystem development of a buzzer-actuated scanner and demodulation electronics designed to interface with a myRIO data acquisition system. Moreover, the use of an active cantilever probe with piezoresistive sensing and thermomechanical actuation significantly reduced experiment setup overhead with improved operational safety. In the end, the developed AFM capabilities are demonstrated with imaging results. The paper also showcases the course design centered around selected subsystems. The new AFM design allows scientific-method-based learning, maximizes utilization of existing resources, and offers potential subsystem upgrades for high-end research applications. The presented instrument and course can help connect members of both the AFM and the mechatronics communities to further develop advanced techniques for new applications.},
keywords = {Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Mechatronics, Nanorobotics, Signal Processing},
pubstate = {published},
tppubtype = {article}
}
Precision mechatronics and nanotechnology communities can both benefit from a course centered around an Atomic Force Microscope (AFM). Developing an AFM can provide precision mechatronics engineers with a valuable multidisciplinary hands-on training experience. In return, such expertise can be applied to the design and implementation of new precision instruments, which helps nanotechnology researchers make new scientific discoveries. However, existing AFMs are not suitable for mechatronics education due to their different original design intentions. Therefore, we address this challenge by developing an AFM intended for precision mechatronics education.
This paper presents the design and implementation of an educational AFM and its corresponding precision mechatronics class. The modular educational AFM is low-cost (<4,000$) and easy to operate. The cost reduction is enabled by new subsystem development of a buzzer-actuated scanner and demodulation electronics designed to interface with a myRIO data acquisition system. Moreover, the use of an active cantilever probe with piezoresistive sensing and thermomechanical actuation significantly reduced experiment setup overhead with improved operational safety. In the end, the developed AFM capabilities are demonstrated with imaging results. The paper also showcases the course design centered around selected subsystems. The new AFM design allows scientific-method-based learning, maximizes utilization of existing resources, and offers potential subsystem upgrades for high-end research applications. The presented instrument and course can help connect members of both the AFM and the mechatronics communities to further develop advanced techniques for new applications.
This paper presents the design and implementation of an educational AFM and its corresponding precision mechatronics class. The modular educational AFM is low-cost (<4,000$) and easy to operate. The cost reduction is enabled by new subsystem development of a buzzer-actuated scanner and demodulation electronics designed to interface with a myRIO data acquisition system. Moreover, the use of an active cantilever probe with piezoresistive sensing and thermomechanical actuation significantly reduced experiment setup overhead with improved operational safety. In the end, the developed AFM capabilities are demonstrated with imaging results. The paper also showcases the course design centered around selected subsystems. The new AFM design allows scientific-method-based learning, maximizes utilization of existing resources, and offers potential subsystem upgrades for high-end research applications. The presented instrument and course can help connect members of both the AFM and the mechatronics communities to further develop advanced techniques for new applications.
Dr. Fangzhou Xia
Research Scientist
Mechanical Engineering Department
Physics Department
Massachusetts Institute of Technology