2024

Fangzhou Xia*; Ivo W Rangelow; Kamal Youcef-Toumi
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation Book
Springer, 2024, ISBN: 978-3-031-44232-2.
Abstract | Links | BibTeX | Tags: Actuator, Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Mechatronics, MEMS, Modeling & Simulation, Motion Control, Nanorobotics, Piezoelectricity, Review, Sensor, Signal Processing, Theory
@book{2023AFMbook,
title = {Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation},
author = {Fangzhou Xia* and Ivo W Rangelow and Kamal Youcef-Toumi},
url = {https://link.springer.com/book/10.1007/978-3-031-44233-9},
doi = {https://doi.org/10.1007/978-3-031-44233-9},
isbn = {978-3-031-44232-2},
year = {2024},
date = {2024-02-06},
urldate = {2023-10-01},
publisher = {Springer},
abstract = {From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of the instrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists.},
keywords = {Actuator, Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Mechatronics, MEMS, Modeling & Simulation, Motion Control, Nanorobotics, Piezoelectricity, Review, Sensor, Signal Processing, Theory},
pubstate = {published},
tppubtype = {book}
}

Abhishek Patkar; Qinghui Meng*; Hanrui Wang; Fangzhou Xia*; Kamal Youcef-Toumi
Time Delay based Neural Network Control of Permanent Magnet Synchronous Motors Journal Article Forthcoming
In: IEEE Transactions on Power Electronics (under review), Forthcoming.
BibTeX | Tags: Automation, Design, Experimentation, Instrumentation, Intelligence, Mechatronics, Modeling & Simulation, Motion Control, Theory
@article{2024IEEETPEL,
title = {Time Delay based Neural Network Control of Permanent Magnet Synchronous Motors},
author = {Abhishek Patkar and Qinghui Meng* and Hanrui Wang and Fangzhou Xia* and Kamal Youcef-Toumi},
year = {2024},
date = {2024-01-01},
urldate = {2024-01-01},
journal = {IEEE Transactions on Power Electronics (under review)},
keywords = {Automation, Design, Experimentation, Instrumentation, Intelligence, Mechatronics, Modeling & Simulation, Motion Control, Theory},
pubstate = {forthcoming},
tppubtype = {article}
}
2023
Jiajie Qiu^; Hongjin Kim^; Fangzhou Xia*; Kamal Youcef-Toumi
Multi-axis Active Vibration Suppression for Wafer Transfer Systems Best Paper Proceedings Article
In: IEEE/ASME Advanced Intelligent Mechatronics, 2023.
Abstract | Links | BibTeX | Tags: Actuator, Automation, Design, Experimentation, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control, Theory
@inproceedings{2023AIM,
title = {Multi-axis Active Vibration Suppression for Wafer Transfer Systems},
author = {Jiajie Qiu^ and Hongjin Kim^ and Fangzhou Xia* and Kamal Youcef-Toumi},
url = {https://ieeexplore.ieee.org/document/10196218},
year = {2023},
date = {2023-06-27},
urldate = {2023-06-27},
booktitle = {IEEE/ASME Advanced Intelligent Mechatronics},
abstract = {Vibration suppression is critical in precision mechatronic systems for nanofabrication. For automated wafer handling in semiconductor plants, Overhead Hoist Transport (OHT) vehicles transport wafers carried in Front Opening Unified Pods (FOUPs); while the wafers are transported in a FOUP, semiconductor chips are at risk of damage by excited small particles due to mechanical vibration. Active suppression of the FOUP vibrations has been proposed to improve the production yield. However, there are two main challenges that make it a non-trivial problem. First, moving FOUPs carried by the OHT vehicles have no external anchoring point as a momentum source for control efforts. Second, no sensor attachment is permitted on mass-production FOUPs, which makes feedback control more challenging without measurement. Since the goal is to suppress the large FOUP acceleration peaks instead of eliminating all vibration, an inertia-based counterbalancing system is designed to address these challenges. To validate this idea, a custom testbed is designed for multi-axis vibration generation and suppression. A Disturbance Observer-Based Controller (DOBC) is developed and implemented on the hardware. During the experiment, 38 percent of the OHT hand unit vibration (and 42 percent of FOUP vibration) suppression is achieved in the OHT travel direction. Moreover, multi-axis FOUP-level acceleration-peak reduction is achieved to verify the effectiveness of the proposed method. },
keywords = {Actuator, Automation, Design, Experimentation, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control, Theory},
pubstate = {published},
tppubtype = {inproceedings}
}
Lufan Wang; Rouying Chu; Fangzhou Xia; Zhuoxuan Li*; Yan Wei; Yiming Rong
Project-based Learning Course Co-designed with Regional Enterprises Proceedings Article
In: ASEE 2023 Annual Exposition & Conference, American Society for Engineering Education, 2023.
Abstract | Links | BibTeX | Tags: Design, Education
@inproceedings{2023ASEE,
title = {Project-based Learning Course Co-designed with Regional Enterprises},
author = {Lufan Wang and Rouying Chu and Fangzhou Xia and Zhuoxuan Li* and Yan Wei and Yiming Rong},
url = {https://peer.asee.org/board-49-project-based-learning-course-co-designed-with-regional-enterprises},
year = {2023},
date = {2023-06-25},
urldate = {2023-06-25},
booktitle = {ASEE 2023 Annual Exposition & Conference},
publisher = {American Society for Engineering Education},
abstract = {Project-based learning (PBL) courses in higher education require the instructor team to be highly resourceful, multi-disciplined, and inspiring. It also needs student teams to be proactive, collaborative, and good at inquiries. Designing and implementing PBL in a classroom can be challenging due to teaching staff shortage and insufficient knowledge of instructors. To address these challenges, we proposed a novel PBL course design methodology to involve local enterprises and entrepreneurs as course co-instructors, thereby compensating for the lack of industry participation in the current PBL course development efforts. The methodology consists of five main pillars: (1) inquiry-based problem solving using practical real-world problems; (2) active knowledge construction through a multidisciplinary team; (3) situated learning through meaningful social interaction with a community of practice; (4) guided investigation with scaffolded instructions on research methodology and technology; and (5) prototype demonstration with expert feedback. To test the effectiveness of the PBL course design methodology, we performed two experiments at Southern University of Science and Technology, a top research university in Shenzhen, China, in a form of a three-week summer school. Two-year data was collected including archival course data, interview data of students, faculty and industry partners, as well as student feedback surveys. We found that the proposed PBL curriculum involving industry mentors can significantly improve students’ engineering design skills and effectiveness of learning.
},
keywords = {Design, Education},
pubstate = {published},
tppubtype = {inproceedings}
}
Fangzhou Xia*; Shane Lovet; Eyan Forsythe; Malek Ibrahim; Kamal Youcef-Toumi
AFM SMILER: A Scale Model Interactive Learning Extended Reality Toolkit for Atomic Force Microscopy based on Digital Twin Technology Journal Article
In: IEEE Transactions on Mechatronics (in preparation), 2023.
Abstract | Links | BibTeX | Tags: Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Intelligence, Mechatronics, MEMS, Modeling & Simulation, Nanorobotics, Sensor, Theory
@article{2023IEEETM,
title = {AFM SMILER: A Scale Model Interactive Learning Extended Reality Toolkit for Atomic Force Microscopy based on Digital Twin Technology},
author = {Fangzhou Xia* and Shane Lovet and Eyan Forsythe and Malek Ibrahim and Kamal Youcef-Toumi},
url = {https://ieeexplore.ieee.org/abstract/document/10136835},
doi = {10.1109/TMECH.2023.3274695},
year = {2023},
date = {2023-06-01},
urldate = {2023-01-01},
journal = {IEEE Transactions on Mechatronics (in preparation)},
abstract = {Atomic force microscope (AFM) is a precision mechatronic system for nanoscale imaging of surfaces. Due to limited instrument access and lack of visualization techniques, understanding its principles can be challenging. Digital twin technology allows the creation of virtual representations of physical systems, which can be particularly useful to address challenges in AFM education. To realistically simulate nanoscale physics, we first developed new efficient algorithms for four virtual scale models, including cantilever mechanics, probe transducers, controller tuning, and contact mechanics. Second, three simulated experiment interactive learning modules are developed for instrument operation, including virtual imaging, system overview, and imaging modalities. In the end, three hardware systems are integrated for an extended reality experience, including a macroscopic AFM scale model, a haptic device for probe-sample interaction force feedback and an upgraded low-cost educational AFM for nanoscale imaging and instrumentation. This completes the eight total modules for the AFM SMILER: A Scale Model Interactive Learning Extended Reality toolkit. Preliminary studies shows the toolkit being helpful for AFM education. In addition to mechatronics and nanotechnology education, techniques developed in this work can be generally applied to computationally efficient realistic digital twin creation.},
keywords = {Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Intelligence, Mechatronics, MEMS, Modeling & Simulation, Nanorobotics, Sensor, Theory},
pubstate = {published},
tppubtype = {article}
}
Yip Fun Yeung*; Fangzhou Xia; Juliana Covarrubias; Mikio Furokawa; Takayuki Hirano; Kamal Youcef-Toumi
Robotic Method and Instrument to Efficiently Synthesize Faulty Conditions and Mass-Produce Faulty-Conditioned Data for Rotary Machines Proceedings Article
In: IEEE International Conference on Robotics and Automation (ICRA), 2023.
Abstract | Links | BibTeX | Tags: Actuator, Automation, Design, Experimentation, Instrumentation, Intelligence, Mechatronics, Motion Control, Theory
@inproceedings{2023ICRA,
title = {Robotic Method and Instrument to Efficiently Synthesize Faulty Conditions and Mass-Produce Faulty-Conditioned Data for Rotary Machines},
author = {Yip Fun Yeung* and Fangzhou Xia and Juliana Covarrubias and Mikio Furokawa and Takayuki Hirano and Kamal Youcef-Toumi},
url = {https://ieeexplore.ieee.org/document/10161055},
year = {2023},
date = {2023-05-29},
urldate = {2023-05-29},
booktitle = {IEEE International Conference on Robotics and Automation (ICRA)},
abstract = {Condition synthesis is vital for generating data for fault detection and diagnosis studies. Traditional methods rely heavily on human labor. This study proposes a robotic method and its instrument to efficiently synthesize faulty conditions and mass-produce data to develop fault detection and diagnosis algorithms. The first contribution is the formalization of a new approach called Robotic Condition Synthesis, which shifts the traditionally labor-intensive task of condition synthesis to a robot-based force control task. The second contribution is developing a new robotic manipulator, which is more effective than current lab-grade robots for the tasks involved in the Robotic Condition Synthesis. The third contribution is empirical evidence of the superiority of this new robot in performing the Robotic Condition Synthesis tasks. This study also explores the potential of the new robot by conducting a three-dimensional system identification of a rotordynamic plant, which lays the foundation for more advanced Robotic Condition Synthesis policies in the future.},
keywords = {Actuator, Automation, Design, Experimentation, Instrumentation, Intelligence, Mechatronics, Motion Control, Theory},
pubstate = {published},
tppubtype = {inproceedings}
}
Jiajie Qiu^; Hongjin Kim^; Fangzhou Xia*; Kamal Youcef-Toumi
Disturbance Rejection Control for Active Vibration Suppression of OHT Wafer Transfer Vehicles Journal Article
In: Machines, vol. 11, no. 2, pp. 125, 2023.
Abstract | Links | BibTeX | Tags: Actuator, Automation, Design, Experimentation, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control, Theory
@article{2023Machines,
title = {Disturbance Rejection Control for Active Vibration Suppression of OHT Wafer Transfer Vehicles},
author = {Jiajie Qiu^ and Hongjin Kim^ and Fangzhou Xia* and Kamal Youcef-Toumi},
url = {https://www.mdpi.com/2075-1702/11/2/125},
doi = {10.3390/machines11020125},
year = {2023},
date = {2023-01-01},
urldate = {2023-01-01},
journal = {Machines},
volume = {11},
number = {2},
pages = {125},
abstract = {In modern semiconductor fabrication plants, automated Overhead Hoist Transport (OHT) vehicles transport wafers in Front Opening Unified Pods (FOUPs). Even in a cleanroom environment, small particles excited by the mechanical vibration of the FOUP can still damage the chips if such particles land on the critical area of the wafers. To minimize the vibration excitation force transferred to the FOUP, this research focuses on controlling the vibration displacement level of an OHT Hand Unit—interface between the OHT vehicle and the FOUP. However, since the OHT vehicle and the FOUP keep traveling, the target system is floating and there exists no external anchoring point for a controlling force source. In addition, no sensor attachments are permitted on mass-production FOUPs, which makes this vibration level suppression problem more challenging. In this research, a custom testbed is designed to replicate the acceleration profile of the OHT vehicle under its travel motion. Then, system modeling and identification is conducted using simulation and experiment to verify the fabricated testbed design. Finally, a Disturbance Observer-Based Controller (DOBC) is developed and implemented on a custom active vibration suppression actuator with inertia force-based counterbalancing to reduce peak vibration amplitude from 870 µm to 230 µm.},
keywords = {Actuator, Automation, Design, Experimentation, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control, Theory},
pubstate = {published},
tppubtype = {article}
}
2022
Fangzhou Xia*; Morgan P Mayborne; Qiong Ma; Kamal Youcef-Toumi
Physical Intelligence in the Metaverse: Mixed Reality Scale Models for Twistronics and Atomic Force Microscopy Proceedings Article
In: 2022 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM), pp. 1722-1729, 2022.
Abstract | Links | BibTeX | Tags: Actuator, Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Intelligence, Material Science, Mechatronics, MEMS, Modeling & Simulation, Nanorobotics, Sensor
@inproceedings{2022IEEEAIM,
title = {Physical Intelligence in the Metaverse: Mixed Reality Scale Models for Twistronics and Atomic Force Microscopy},
author = {Fangzhou Xia* and Morgan P Mayborne and Qiong Ma and Kamal Youcef-Toumi},
url = {https://ieeexplore.ieee.org/document/9863383},
doi = {10.1109/AIM52237.2022.9863383},
year = {2022},
date = {2022-01-01},
urldate = {2022-01-01},
booktitle = {2022 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM)},
pages = {1722-1729},
abstract = {Physical intelligence (PI) is an emerging research field using new multi-functional smart materials in mechatronic designs. On the microscopic scale, PI principles give rise to unconventional transducers, which are especially useful for micro/nano-robot design with size and resource constrains. Since it is not easy to directly observe nanoscale multi-physics phenomenon, understanding their principles can be challenging. In this work, we bring PI principles into the metaverse to bridge this gap by developing two mixed reality scale models. The first example is a virtual reality (VR) 2D material twistronics visualizer to demonstrate the novel intelligent 2D materials with tunable properties as a rising field in condensed matter physics. Users can interactively control the cross-coupling multi-physics phenomena and observe the visualized material responses. The second example is centered around an Atomic Force Microscope (AFM) to illustrate its imaging and probe principles. For interaction, users can control the twist angle using atomic lattice models and feel the AFM cantilever force using custom haptic devices. We believe these tools can help precision mechatronic engineers understand and make better use of physical intelligence building blocks to design micro-electromechanical systems.},
keywords = {Actuator, Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Intelligence, Material Science, Mechatronics, MEMS, Modeling & Simulation, Nanorobotics, Sensor},
pubstate = {published},
tppubtype = {inproceedings}
}
2021
Fangzhou Xia*; James Edwin Quigley; Xiaotong Zhang; Chen Yang; Yi Wang; Kamal Youcef-Toumi
A Modular Low-cost Atomic Force Microscope for Precision Mechatronics Education Journal Article
In: Mechatronics, vol. 76, pp. 102550, 2021, ISSN: 0957-4158.
Abstract | Links | BibTeX | Tags: Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Mechatronics, Nanorobotics, Signal Processing
@article{2021Mechatronics,
title = {A Modular Low-cost Atomic Force Microscope for Precision Mechatronics Education},
author = {Fangzhou Xia* and James Edwin Quigley and Xiaotong Zhang and Chen Yang and Yi Wang and Kamal Youcef-Toumi},
url = {https://www.sciencedirect.com/science/article/abs/pii/S0957415821000441},
issn = {0957-4158},
year = {2021},
date = {2021-01-01},
urldate = {2021-01-01},
journal = {Mechatronics},
volume = {76},
pages = {102550},
publisher = {Elsevier},
abstract = {Precision mechatronics and nanotechnology communities can both benefit from a course centered around an Atomic Force Microscope (AFM). Developing an AFM can provide precision mechatronics engineers with a valuable multidisciplinary hands-on training experience. In return, such expertise can be applied to the design and implementation of new precision instruments, which helps nanotechnology researchers make new scientific discoveries. However, existing AFMs are not suitable for mechatronics education due to their different original design intentions. Therefore, we address this challenge by developing an AFM intended for precision mechatronics education.
This paper presents the design and implementation of an educational AFM and its corresponding precision mechatronics class. The modular educational AFM is low-cost (<4,000$) and easy to operate. The cost reduction is enabled by new subsystem development of a buzzer-actuated scanner and demodulation electronics designed to interface with a myRIO data acquisition system. Moreover, the use of an active cantilever probe with piezoresistive sensing and thermomechanical actuation significantly reduced experiment setup overhead with improved operational safety. In the end, the developed AFM capabilities are demonstrated with imaging results. The paper also showcases the course design centered around selected subsystems. The new AFM design allows scientific-method-based learning, maximizes utilization of existing resources, and offers potential subsystem upgrades for high-end research applications. The presented instrument and course can help connect members of both the AFM and the mechatronics communities to further develop advanced techniques for new applications.},
keywords = {Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Mechatronics, Nanorobotics, Signal Processing},
pubstate = {published},
tppubtype = {article}
}
This paper presents the design and implementation of an educational AFM and its corresponding precision mechatronics class. The modular educational AFM is low-cost (<4,000$) and easy to operate. The cost reduction is enabled by new subsystem development of a buzzer-actuated scanner and demodulation electronics designed to interface with a myRIO data acquisition system. Moreover, the use of an active cantilever probe with piezoresistive sensing and thermomechanical actuation significantly reduced experiment setup overhead with improved operational safety. In the end, the developed AFM capabilities are demonstrated with imaging results. The paper also showcases the course design centered around selected subsystems. The new AFM design allows scientific-method-based learning, maximizes utilization of existing resources, and offers potential subsystem upgrades for high-end research applications. The presented instrument and course can help connect members of both the AFM and the mechatronics communities to further develop advanced techniques for new applications.
2019
Chen Yang*; Fangzhou Xia; Yi Wang; Stephen Truncale; Kamal Youcef-Toumi
Design and Control of a Multi-Actuated Nanopositioning Stage with Stacked Structure Proceedings Article
In: IEEE American Control Conference (ACC), pp. 3782-3788, 2019.
Abstract | Links | BibTeX | Tags: Actuator, Atomic Force Microscopy, Design, Experimentation, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control
@inproceedings{2019ACC_2,
title = {Design and Control of a Multi-Actuated Nanopositioning Stage with Stacked Structure},
author = {Chen Yang* and Fangzhou Xia and Yi Wang and Stephen Truncale and Kamal Youcef-Toumi},
url = {https://ieeexplore.ieee.org/document/8815299},
year = {2019},
date = {2019-01-01},
urldate = {2019-01-01},
booktitle = {IEEE American Control Conference (ACC)},
pages = {3782-3788},
abstract = {A novel multi-actuated nanopositioning stage with stacked structure has been developed. The aim is to achieve both high bandwidth and large motion range. Symmetric flexures are designed to obtain equal stiffness along any direction in the lateral plane. With this design, the lateral stiffness and corresponding bending mode resonance frequency can be optimized. Both analytical model and finite element analysis are employed to predict the dominant resonance frequency. Experimental results indicate that the dominant resonance of nanopositioner is at 28.2 kHz, with a motion range of 16.5J.1m. A disturbance-observer-based controller is implemented to suppress the hysteretic nonlinearity. The new design and control system enable high-bandwidth and high-precision nanopositioning up to 2 kHz.},
keywords = {Actuator, Atomic Force Microscopy, Design, Experimentation, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control},
pubstate = {published},
tppubtype = {inproceedings}
}



Dr. Fangzhou Xia
Research Scientist
Mechanical Engineering Department
Physics Department
Massachusetts Institute of Technology